Determination of the K Longest Dynamic Functional Paths in a Combinational Circuit
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چکیده
Test pattern generation and diagnosis algorithms that target realistic bridging faults must be provided with a realistic fault list. In this work we describe FedEx, a bridging fault extractor that extracts a circuit from the mask layout, identifies the two-node bridges that can occur, their locations, layers, and relative probability of occurrence. Our experimental results show that FedEx is memory efficient and fast.
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تاریخ انتشار 2001